LEMON Manuals: Even more car manuals for everyone
Home >> Saturn >> 2007 >> Ion Red Line >> Repair and Diagnosis (Single Page) >> Accessories & Equipment >> Anti-Theft Systems >> Power Door Lock System And Release Systems >> Diagnostic Information and Procedures >> Trunk Release Inoperative >> Circuit/System Testing

Circuit/System Testing

Rear Compartment Lid Release Switch Malfunction

  1. Ignition OFF, disconnect the harness connector at the Rear Compartment Lid Release Switch.
  2. Ignition ON, verify that a test lamp illuminates between the B+ circuit terminal D and ground.
    • If the test lamp does not illuminate, test the B+ circuit for a short to ground or an open/high resistance. If the circuit tests normal and the B+ circuit fuse is open, test the circuit terminal D for a short to ground.
  3. If all circuits test normal, test or replace the Rear Compartment Lid Release Switch

Rear Compartment Lid Release Malfunction

  1. Ignition OFF, disconnect the harness connector 4 at the Rear Compartment Lid Latch.
  2. Test for less than 1.0 ohm of resistance between the Rear Compartment Lid Latch ground circuit terminal 3 and ground
    • If greater than the specified range, test the ground circuit for an open/high resistance.
  3. Connect a test lamp between the control circuit terminal 4 and ground.
  4. Command the Trunk Release ON and OFF with a scan tool. The test lamp should turn ON and OFF when changing between the commanded states.
    • If the test lamp is always ON, test the control circuit for a short to voltage. If the circuit tests normal, replace the BCM.
    • If the test lamp is always OFF and the circuit fuse is good, test the control circuit for an open/high resistance. If the circuit tests normal, test or replace the BCM.
    • If the test lamp is always OFF and the circuit fuse is open, test the control circuit for a short to ground. If the circuit tests normal, test or replace the Rear Compartment Lid Latch.
  5. If all circuits test normal, test or replace the Rear Compartment Lid Latch.